@ARTICLE{4419913, author={Yu-Cheng Fan}, journal={Instrumentation and Measurement, IEEE Transactions on}, title={Testing-Based Watermarking Techniques for Intellectual-Property Identification in SOC Design}, year={2008}, volume={57}, number={3}, pages={467-479}, keywords={design for testability;industrial property;system-on-chip;watermarking;SOC design;intellectual-property identification;system-on-a-chip design-for-test strategies;testing-based watermarking techniques;watermark-generating circuit;Design-for-test (DFT);intellectual-property (IP) identification;system-on-a-chip (SOC);very large scale integration (VLSI) design;watermarking}, doi={10.1109/TIM.2007.911623}, ISSN={0018-9456},}