@INPROCEEDINGS{6176634,
author={Rajendran, J. and Pino, Y. and Sinanoglu, O. and Karri, R},
booktitle={Design, Automation Test in Europe Conference Exhibition (DATE), 2012},
title={Logic encryption: A fault analysis perspective},
year={2012},
pages={953-958},
keywords={cryptography;fault diagnosis;integrated circuit design;integrated circuit testing;logic circuits;logic gates;Hamming distance target;IC design flow;IC industry;IC overbuilding;IC piracy;IC protection;IC testing;fault propagation analysis perspective;gates inserting design;hardware trojan insertion;integrated circuit design flow;logic encryption technique;supply chain rogue element},
doi={10.1109/DATE.2012.6176634},
ISSN={1530-1591},}